Untertitel:: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Verlag:: SPRINGER
Erschienen:: 25.08.2006
Seitenanzahl:: 600
ISBN:: 3540319158
EAN:: 9783540319153
Sprache:: Englisch
Format:: PDF
Schutz:: Dig. Wass.

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Microscopy of Semiconducting Materials

<P>The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.</P>